Infrared, Raman and XPS spectroscopic studies of Bi2O3-B2O3-GeO2 glasses

Solid State Sciences

Volumn 12, Issue 4, 2010, Pages 541-545

  Fan, Huiyan ^a,b   Gao, Guojun ^a,b   Wang, Guonian ^a   Hu, Lili ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Disordered systems; Photoelectron spectroscopies; Structural properties

Indexed keywords

CRYSTALLIZATION TEMPERATURE; CUT-OFF; DISORDERED SYSTEM; DISORDERED SYSTEMS; GLASS NETWORK; GLASS TRANSITION TEMPERATURE; MELTING METHOD; NON-BRIDGING OXYGEN; OPTICAL BASICITY; SPECTROSCOPIC STUDIES; THERMAL PROPERTIES; XPS;

COMPUTATIONAL MECHANICS; GERMANIUM; GLASS; GLASS TRANSITION; INFRARED SPECTROSCOPY; OXYGEN; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; REFRACTIVE INDEX; SINGLE CRYSTAL SURFACES; SPECTROSCOPIC ANALYSIS; THERMOANALYSIS; THERMODYNAMIC PROPERTIES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77949918549     PISSN: 12932558     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solidstatesciences.2009.12.021     Document Type: Article

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