Fault detection and identification method based on multivariate statistical techniques

ETFA 2009 - 2009 IEEE Conference on Emerging Technologies and Factory Automation

Volumn , Issue , 2009, Pages

  Fuente, M J ^a   Garcia Alvarez, D ^a   Sainz Palmero, G I ^a   Villegas, T ^a,b  

^a UNIVERSITY OF VALLADOLID   (Spain)

^b UNIVERSIDAD SIMÓN BOLÍVAR   (Venezuela)

Author keywords

[No Author keywords available]

Indexed keywords

DIAGNOSIS FAULTS; DIMENSIONAL REPRESENTATION; FAULT DETECTION AND IDENTIFICATION; FAULT DIAGNOSIS; FISHER'S DISCRIMINANT; MULTIVARIATE STATISTICAL METHOD; MULTIVARIATE STATISTICAL TECHNIQUES; PARTIAL LEAST SQUARES; STATISTICAL PROCESS MONITORING;

DIAGNOSIS; DISCRIMINANT ANALYSIS; FACTORY AUTOMATION; FAILURE ANALYSIS; MULTIVARIANT ANALYSIS; PRINCIPAL COMPONENT ANALYSIS; PROCESS MONITORING; SEMICONDUCTOR QUANTUM DOTS; STATISTICAL PROCESS CONTROL;

FAULT DETECTION;

EID: 77949898148     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETFA.2009.5346998     Document Type: Conference Paper

References (13)

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