Challenges and opportunities in high-precision Be-10 measurements at CAMS

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 7-8, 2010, Pages 730-732

  Rood, Dylan H ^a,b   Hall, Sarah ^c   Guilderson, Thomas P ^a,c   Finkel, Robert C ^d,e   Brown, Thomas A ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d CEREGE   (France)

^e UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

AMS; Beryllium 10; Efficiency; Ion source

Indexed keywords

AMS; BEAM CURRENTS; CHARGE EXCHANGES; DETECTION LIMITS; HIGH-PRECISION; IONIZATION EFFICIENCY; LOW BACKGROUND; OVERALL EFFICIENCY; PRECISE MEASUREMENTS; SMALL SAMPLE SIZE; SPUTTER SOURCES; STANDARD MATERIALS; SYSTEM EFFICIENCY;

ASSOCIATIVE STORAGE; BERYLLIUM; CAMS; CESIUM; CHARGE TRANSFER; ION SOURCES; IONIZATION; MASS SPECTROMETRY; PARTICLE DETECTORS;

IONS;

EID: 77949893629     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.10.016     Document Type: Article

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