Boundary value testing using integrated circuit fault detection rule

TAIC PART 2009 - Testing: Academic and Industrial Conference - Practice and Research Techniques

Volumn , Issue , 2009, Pages 3-12

  Zhao, Ruilian ^a   Li, Zheng ^b  

^a BEIJING UNIVERSITY OF CHEMICAL TECHNOLOGY   (China)

^b KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

Boundary value testing; Fault detection; Test case generation

Indexed keywords

BOUNDARY VALUE TESTING; BOUNDARY VALUES; EMPIRICAL STUDIES; FAULT COVERAGES; FUNCTIONAL TESTING; INERTIAL MEASUREMENT UNIT; NEW APPROACHES; TEST CASE GENERATION; TEST COST;

COST REDUCTION; FAULT DETECTION; INTEGRATED CIRCUITS; UNITS OF MEASUREMENT;

INTEGRATED CIRCUIT TESTING;

EID: 77949836775     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TAICPART.2009.33     Document Type: Conference Paper

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