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note
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We thank the Swiss National Science Foundation and the National Center of Competence in Research "Quantum Photonics" for support and L. Nevou for key contributions to the reflectivity measurement. This work was partly carried out in the Center for Micro- and Nanotechnology (FIRST) at ETH Zurich. J.F. would like to acknowledge fruitful discussions with E. Yablonovitch and A. Imamoglu.
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