Validity criteria of the discrete dipole approximation

Applied Optics

Volumn 49, Issue 8, 2010, Pages 1267-1279

  Zubko, Evgenij ^a,b,c   Petrov, Dmitry ^b   Grynko, Yevgen ^d   Shkuratov, Yuriy ^b   Okamoto, Hajime ^a   Muinonen, Karri ^c,e   Nousiainen, Timo ^c   Kimura, Hiroshi ^f   Yamamoto, Tetsuo ^g   Videen, Gorden ^h  

^a TOHOKU UNIVERSITY   (Japan)

^b V N KARAZIN KHARKIV NATIONAL UNIVERSITY   (Ukraine)

^c UNIVERSITY OF HELSINKI   (Finland)

^d BASF SE   (Germany)

^e FINNISH GEODETIC INSTITUTE   (Finland)

^f KOBE UNIVERSITY   (Japan)

^g HOKKAIDO UNIVERSITY   (Japan)

^h Center for Extrasolar Planetary Systems   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CELLS; ELECTROMAGNETIC FIELDS; LIGHT SCATTERING; MAXWELL EQUATIONS; REFRACTIVE INDEX; SURFACE ROUGHNESS;

COMPLEX REFRACTIVE INDEX; CONSTITUENT MATERIALS; DIELECTRIC PARTICLES; DISCRETE DIPOLE APPROXIMATION; IRREGULARLY SHAPED PARTICLES; NONSPHERICAL PARTICLE; SCATTERING PROPERTY; SMALL-SCALE SURFACE ROUGHNESS;

CYTOLOGY;

EID: 77949777560     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.49.001267     Document Type: Article

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