Real-time atomic force microscopy imaging of photoinduced surface deformation in Asx Se100-x chalcogenide films

Applied Physics Letters

Volumn 96, Issue 11, 2010, Pages

  Trunov, M L ^a   Lytvyn, P M ^b   Nagy, P M ^c   Dyachyns'Ka, O M ^b  

^a UZHGOROD NATIONAL UNIVERSITY   (Ukraine)

^b INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^c CHEMICAL RESEARCH CENTER   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE; BAND GAPS; CHALCOGENIDE FILMS; DIRECT MEASUREMENT; FILM COMPOSITION; IN-SITU; INCIDENT LIGHT; INTERFERENCE PATTERNS; PHOTO-INDUCED SURFACES; REAL TIME; SURFACE DEFORMATION; SURFACE RELIEF GRATINGS;

ATOMIC FORCE MICROSCOPY; DEFORMATION;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 77949743334     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3360229     Document Type: Article

References (21)

1. Photo-Induced Metastability in Amorphous Semiconductors, edited by, A. V. Kolobov, (Wiley, Weinheim, 2003). 10.1002/9783527602544
2. S. N. Yannopoulos and M. L. Trunov, Phys. Status Solidi B 0370-1972 246, 1773 (2009). 10.1002/pssb.200982005
3. T. V. Galstyan, J. -F. Viens, A. Villeneuve, K. Richardson, and M. A. Duguay, J. Lightwave Technol. 0733-8724 15, 1343 (1997). 10.1109/50.618337
4. K. E. Asatryan, T. Galstian, and R. Vaĺe, Phys. Rev. Lett. 0031-9007 94, 087401 (2005). 10.1103/PhysRevLett.94.087401
5. A. Saliminia, T. V. Galstian, and A. Villeneuve, Phys. Rev. Lett. 0031-9007 85, 4112 (2000). 10.1103/PhysRevLett.85.4112
6. M. L. Trunov, JETP Lett. 0021-3640 86, 313 (2007). 10.1134/ S0021364007170079
7. B. T. Kolomiets and V. M. Lyubin, Mater. Res. Bull. 0025-5408 13, 1343 (1978). 10.1016/0025-5408(78)90125-3
8. Y. Ikeda and K. Shimakawa, J. Non-Cryst. Solids 0022-3093 338-340, 539 (2004). 10.1016/j.jnoncrysol.2004.03.037
9. Y. Ikeda and K. Shimakawa, J. Non-Cryst. Solids 0022-3093 352, 1582 (2006). 10.1016/j.jnoncrysol.2005.12.034
10. V. M. Kryshenik, M. L. Trunov and V. P. Ivanitsky, J. Optoelectron. Adv. Mater. 1454-4164 9, 1949 (2007).
11. M. Trunov, P. Lytvyn, V. Takats, I. Charnovich and S. Kokenyesi, J. Optoelectron. Adv. Mater. 1454-4164 11, 1959 (2009).
12. M. L. Trunov, P. M. Nagy, V. Takats, P. M. Lytvyn, S. Kokenyesi, and E. Kalman, J. Non-Cryst. Solids 0022-3093 355, 1993 (2009). 10.1016/j.jnoncrysol. 2009.04.055
13. D. G. Georgiev, P. Boolchand, and M. Micoulaut, Phys. Rev. B 0163-1829 62, R9228 (2000). 10.1103/PhysRevB.62.R9228
14. J. P. DeNeufville, S. C. Moss, and S. R. Ovshinsky, J. Non-Cryst. Solids 0022-3093 13, 191 (1974). 10.1016/0022-3093(74)90091-X
15. K. Tanaka, J. Non-Cryst. Solids 0022-3093 266-269, 889 (2000). 10.1016/S0022-3093(99)00861-3
16. A. Feltz, Amorphous Inorganic Materials and Glasses (VCH, New York, 1993).
17. H. Fritzsche, Phys. Rev. B 0163-1829 52, 15854 (1995). 10.1103/PhysRevB.52.15854
18. M. L. Trunov, V. S. Bilanich, S. N. Dub, and R. S. Shmegera, JETP Lett. 0021-3640 82, 504 (2005). 10.1134/1.2150870
19. M. L. Trunov and V. S. Bilanich, J. Optoelectron. Adv. Mater. 1454-4164 6, 157 (2004).
20. S. N. Yannopoulos, Phys. Rev. B 0163-1829 68, 064206 (2003). 10.1103/PhysRevB.68.064206
21. F. Kyriazis and S. N. Yannopoulos, Appl. Phys. Lett. 0003-6951 94, 101901 (2009). 10.1063/1.3095849