Introduction to the issue on compressive sensing

IEEE Journal on Selected Topics in Signal Processing

Volumn 4, Issue 2, 2010, Pages 241-243

  Chartrand, Rick ^a   Baraniuk, Richard G ^b   Eldar, Yonina C ^c   Figueiredo, Mário A T ^d   Tanner, Jared ^e  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b RICE UNIVERSITY   (United States)

^c TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^d INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^e UNIVERSITY OF EDINBURGH   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77949742215     PISSN: 19324553     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTSP.2010.2043892     Document Type: Editorial

References (0)