Plasmonic dark field microscopy

Applied Physics Letters

Volumn 96, Issue 11, 2010, Pages

  Hu, Houdong ^a   Ma, Changbao ^a   Liu, Zhaowei ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHIP-SCALE; DARK FIELD MICROSCOPY; HIGH-CONTRAST IMAGES; MULTI-LAYERED STRUCTURE;

PLASMONS;

EID: 77949735919     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3367729     Document Type: Article

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