Present status of theoretical modeling the magnetoelectric effect in magnetostrictive-piezoelectric nanostructures. Part II: Magnetic and magnetoacoustic resonance ranges

Journal of Applied Physics

Volumn 107, Issue 5, 2010, Pages 228-

  Bichurin, M I ^a   Petrov, V M ^a   Averkin, S V ^a   Liverts, E ^b  

^a YAROSLAV THE WISE NOVGOROD STATE UNIVERSITY   (Russian Federation)

^b BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC RESONANCE; AVERAGE STRESS; BI-LAYER; DESIGN AND ANALYSIS; ELASTIC MODES; ELECTRICAL CONTROL; HIGH FREQUENCY; HIGH FREQUENCY DEVICES; LAYER THICKNESS; LAYERED STRUCTURES; M-E EFFECT; MAGNETO-ELASTIC; ME VOLTAGE COEFFICIENTS; PRESENT STATUS; RESONANCE FIELD; RESONANCE REGION; THEORETICAL MODELING; CLAMPING EFFECTS; DISTINCTIVE FEATURES; ELECTROMECHANICAL RESONANCE REGION; ELECTROMECHANICAL RESONANCES; FLEXURAL DEFORMATIONS; FLEXURAL STRAIN; LEAD ZIRCONATE TITANATE; LOW FREQUENCY; MAGNETOSTATIC EQUATIONS; MAGNETOSTRICTIVE MATERIAL; MATERIAL PARAMETER; MATRIX; ME COEFFICIENT; MECHANICAL DEFORMATION; NANOPILLARS; NICKEL FERRITE; RATE OF CHANGE; SRTIO; SUBSTRATE THICKNESS; THERMODYNAMIC THEORY;

ELECTRIC FIELDS; FERRITE; FERROMAGNETIC RESONANCE; MAGNETOACOUSTIC EFFECTS; MAGNETOELECTRIC EFFECTS; MAGNETOSTRICTIVE DEVICES; MICROWAVE DEVICES; PIEZOELECTRICITY; RESONANCE; SEMICONDUCTOR DEVICES; COMPOSITE MICROMECHANICS; DEFORMATION; LATTICE MISMATCH; NANOSTRUCTURES; THICK FILMS;

COMPOSITE MICROMECHANICS; SUBSTRATES;

EID: 77949733973     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.3313920     Document Type: Article

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