Possibilities and limitations of X-ray diffraction using high-energy X-rays on a laboratory system

Zeitschrift fur Kristallographie, Supplement

Volumn , Issue 30, 2009, Pages 163-169

  Te Nijenhuis, J ^a   Gateshki, M ^a   Fransen, M J ^a  

^a MALVERN INSTRUMENTS LTD   (United Kingdom)

Author keywords

Diffraction; High energy X rays; Nanocrystalline materials; Pair distribution function

Indexed keywords

EID: 77949634766     PISSN: 0930486X     EISSN: None     Source Type: Journal    
DOI: 10.1524/zksu.2009.0023     Document Type: Conference Paper

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