Ultra-thin silicon solar cell: Modelling and characterisation

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 5, 2008, Pages 1407-1410

  Danos, L ^a   Jones, G ^a   Greef, R ^a   Markvart, T ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISATION; CRYSTALLINE SILICON SOLAR CELLS; INTERFERENCE EFFECTS; IV CHARACTERISTICS; MULTIPLE REFLECTIONS; SILICON LAYER; SPECTRAL RESPONSE; ULTRA-THIN; ULTRATHIN SILICON; UNIVERSITY OF SOUTHAMPTON; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY;

MATHEMATICAL MODELS; SOLAR CELLS; SPECTROSCOPIC ELLIPSOMETRY;

SILICON SOLAR CELLS;

EID: 77949603707     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200777809     Document Type: Conference Paper

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