Preparation and characterization of NiFe2O4/NiO composite film via a single-source precursor route

Journal of Physics and Chemistry of Solids

Volumn 71, Issue 4, 2010, Pages 604-607

  Zhang, Yingchao ^a   Zhang, Fazhi ^a   Lu, Yanluo ^a   Chen, Tingting ^a   Yang, Lan ^a  

^a BEIJING UNIVERSITY OF CHEMICAL TECHNOLOGY   (China)

Author keywords

A. Inorganic compounds; B. Chemical synthesis; C. X ray diffraction

Indexed keywords

C. X-RAY DIFFRACTION; CHEMICAL SYNTHESIS; ENERGY DISPERSIVE X-RAY SPECTROMETRY; FOURIER TRANSFORM INFRARED; HIGH-TEMPERATURE CALCINATION; LAYERED DOUBLE HYDROXIDES; MICROSTRUCTURE AND PROPERTIES; MOLAR RATIO; NANOCOMPOSITE THIN FILMS; NIO COMPOSITES; SEM; SINGLE-SOURCE PRECURSOR; SYNTHETIC APPROACH; THICKNESS OF THE FILM; VIBRATING SAMPLE MAGNETOMETER;

CALCINATION; COMPLEXATION; COMPOSITE FILMS; INFRARED SPECTROSCOPY; INORGANIC COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION;

FILM PREPARATION;

EID: 77949571530     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2009.12.047     Document Type: Article

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