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Materials Chemistry and Physics

Volumn 121, Issue 1-2, 2010, Pages 378-384

Effect of annealing on structural and optical properties of zinc oxide films

(2) Elilarassi, R a Chandrasekaran, G a

a PONDICHERRY UNIVERSITY (India)

Author keywords

Annealing; Luminescence; Optical properties; Thin films

Indexed keywords

ANNEALING TEMPERATURES; ANNEALING TREATMENTS; AS ANNEALING; BLUE-SHIFTED; CHEMICAL COMPOSITIONS; CRYSTALLINITIES; DEEP LEVEL EMISSION; DEPOSITION METHODS; ENERGY DISPERSIVE ANALYSIS; FULL WIDTH HALF MAXIMUM; GRAIN SIZE; HEXAGONAL WURTZITE; HEXAGONAL WURTZITE STRUCTURE; LIQUID FLOW; NANOCRYSTALLINE ZNO; POLYCRYSTALLINE; POST ANNEALING; RED SHIFT; REMOVAL OF IMPURITIES; ROOM-TEMPERATURE PHOTOLUMINESCENCE; SEM; SEM MICROGRAPHS; STRUCTURAL AND OPTICAL PROPERTIES; TEMPERATURE RANGE; UV- AND; UV-VIS-NIR; VISIBLE REGION; X-RAY DIFFRACTION MEASUREMENTS; XRD PEAKS; YELLOW EMISSIONS; ZNO FILMS; ZNO NANOPARTICLES;

AMORPHOUS MATERIALS; ANNEALING; DEPOSITION; LIGHT; METALLIC FILMS; NANOPARTICLES; OPTICAL PROPERTIES; OXIDE FILMS; PHOTOLUMINESCENCE; PHOTOLUMINESCENCE SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; STRUCTURAL PROPERTIES; SURFACE STRUCTURE; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC OXIDE; ZINC SULFIDE;

OPTICAL FILMS;

EID: 77949491696 PISSN: 02540584 EISSN: None Source Type: Journal
DOI: 10.1016/j.matchemphys.2010.01.053 Document Type: Article

Times cited : (49)

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