Structural and dielectric relaxor properties of yttrium-doped Ba(Zr0.25Ti0.75)O3 ceramics

Materials Chemistry and Physics

Volumn 121, Issue 1-2, 2010, Pages 147-153

  Badapanda, T ^a   Rout, S K ^b   Cavalcante, L S ^c   Sczancoski, J C ^c   Panigrahi, S ^a   Sinha, T P ^d   Longo, E ^c  

^a NATIONAL INSTITUTE OF TECHNOLOGY   (India)

^b BIRLA INSTITUTE OF TECHNOLOGY   (India)

^c SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^d BOSE INSTITUTE   (India)

Author keywords

Ceramics; Electrical properties; Microscopy; Sintering

Indexed keywords

CERAMICS; CRYSTALLINE CERAMICS; CUBIC STRUCTURE; CURIE WEISS LAW; DIELECTRIC PERMITTIVITIES; DIELECTRIC RELAXOR; DIFFUSIVITIES; ELECTRICAL PROPERTY; FREQUENCY MEASUREMENTS; FREQUENCY RANGES; HIGH TEMPERATURE; RELAXATION STRENGTH; RELAXOR PROPERTIES; TEMPERATURE DEPENDENT; VOGEL-FULCHER EQUATIONS;

BARIUM; CERAMIC MATERIALS; DIELECTRIC PROPERTIES; HOLOGRAPHIC INTERFEROMETRY; OXIDE MINERALS; PEROVSKITE; SCANNING ELECTRON MICROSCOPY; SINTERING; SOLID STATE REACTIONS; X RAY DIFFRACTION; YTTRIUM; ZIRCONIUM;

YTTRIUM ALLOYS;

EID: 77949485576     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2010.01.008     Document Type: Article

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