메뉴 건너뛰기




Volumn , Issue , 2005, Pages 898-903

In situ X-ray micro-tomography analysis of metallic powder compact components

Author keywords

Cone beam micro tomography; Metallic powder; Sintering

Indexed keywords

FIRE FIGHTING EQUIPMENT; NONDESTRUCTIVE EXAMINATION; POWDER METALS; SCANNING ELECTRON MICROSCOPY; SINTERING; TOMOGRAPHY;

EID: 77949485376     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (13)
  • 3
    • 0026632218 scopus 로고
    • Predicting the Contact Resistance Distribution of Electrical Contacts by Modeling The Contact Interface
    • CAVEN JR. R. W., JALALI J., (1991), Predicting the Contact Resistance Distribution of Electrical Contacts by Modeling The Contact Interface, Proc. 37-th IEEE Holm Conf. pp. 83-89.
    • (1991) Proc. 37-th IEEE Holm Conf , pp. 83-89
    • Caven, J.R.1    Jalali, J.2
  • 4
    • 0032312018 scopus 로고    scopus 로고
    • The Effect of Contact Capacitance on Current-Voltage Characteristics of Stationary Metal Contacts
    • DERVOS C. T., MICHAELIDES J. M., (1998), The Effect of Contact Capacitance on Current-Voltage Characteristics of Stationary Metal Contacts, IEEE Trans. Compon. Pack. A 21(4), pp. 152-164.
    • (1998) IEEE Trans. Compon. Pack. A , vol.21 , Issue.4 , pp. 152-164
    • Dervos, C.T.1    Michaelides, J.M.2
  • 6
    • 0001362304 scopus 로고    scopus 로고
    • Field Activated Sintering
    • Powder Metallurgy, American Society of Materials, Materials Park, OH
    • GROZA J. R., (1998), Field Activated Sintering, ASM Handbook, Vol. 7, Powder Metallurgy, American Society of Materials, Materials Park, OH, pp. 583-589.
    • (1998) ASM Handbook , vol.7 , pp. 583-589
    • Groza, J.R.1
  • 9
    • 0004005306 scopus 로고
    • 2nd ed. New York, Wiley Interscience Publications
    • SZE S. M., (1981), Physics of Semiconductor Devices, 2nd ed. New York, Wiley Interscience Publications.
    • (1981) Physics of Semiconductor Devices
    • Sze, S.M.1
  • 10
    • 0003788740 scopus 로고
    • London, New York, Longman
    • THOMAS T. R. ED., (1982), Rough Surfaces, London, New York, Longman.
    • (1982) Rough Surfaces
    • Thomas, T.R.1
  • 11
    • 34948867143 scopus 로고    scopus 로고
    • 3-D X-Ray Microtomography at MEC Romania
    • TISEANU, I, (2003), 3-D X-Ray Microtomography at MEC Romania, EFDA Fusion Newsletter, 6, 4, pp. 7.
    • (2003) EFDA Fusion Newsletter , vol.6 , Issue.4 , pp. 7
    • Tiseanu, I.1
  • 12
    • 18844446848 scopus 로고    scopus 로고
    • Non-Destructive Analysis Of Miniaturized Fusion Materials Samples And Irradiation Capsules By X Ray Micro-Tomography
    • Fondazione Cini, Venice, Italy
    • TISEANU I., CRACIUNESCU T., MANDACHE B. N., (2004), Non-Destructive Analysis Of Miniaturized Fusion Materials Samples And Irradiation Capsules By X Ray Micro-Tomography, In Proc.: 23rd Symposium on Fusion Technology, Fondazione Cini, Venice, Italy.
    • (2004) In Proc.: 23rd Symposium on Fusion Technology
    • Tiseanu, I.1    Craciunescu, T.2    Mandache, B.N.3
  • 13
    • 0000655711 scopus 로고
    • Asperity Persistence between Rough Surfaces
    • WILLIAMSON J. B. P., HUNT R. T., (1972), Asperity Persistence between Rough Surfaces, Proc. Roy. Soc. A 327, pp. 147-157.
    • (1972) Proc. Roy. Soc. A , vol.327 , pp. 147-157
    • Williamson, J.B.P.1    Hunt, R.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.