Automation of 3D scan data capturing and processing

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7526, Issue , 2010, Pages

  Sitnik, Robert ^a   Karaszewski, Maciej ^a   Załuski, Wojciech ^a   Rutkiewicz, Jan ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Automated 3D shape measurement; Cultural heritage 3D digitization; Next best view; Structured light

Indexed keywords

3-D SHAPE MEASUREMENT; 3D DIGITIZATION; CULTURAL HERITAGES; NEXT BEST VIEW; STRUCTURED LIGHT;

AUTOMATION; COMPUTER CONTROL SYSTEMS; DATA PROCESSING; IMAGE PROCESSING; IMAGING SYSTEMS; MEASUREMENTS; PROCESSING; SURFACE MEASUREMENT;

THREE DIMENSIONAL;

EID: 77949478949     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.839189     Document Type: Conference Paper

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