Erratum: Characterization of focused-ion-beam induced defect structures in graphite for the future guided self-assembly of molecules (Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures (2009) 27 (2209))

Journal of Vacuum Science and Technology B

Volumn 28, Issue 1, 2010, Pages 216-

  O'Donnell, Sarah E ^a   Reinke, Petra ^b  

^a MITRE CORPORATION   (United States)

^b UNIVERSITY OF VIRGINIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77949415452     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.3269793     Document Type: Erratum

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