Effect of repetition in micro scale pin-hole interference fit

2009 IEEE International Symposium on Assembly and Manufacturing, ISAM 2009

Volumn , Issue , 2009, Pages 107-112

  Kim, Jin Woong ^a   Ahn, Sung Hoon ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM PLATES; ANALYTICAL MODEL; ASSEMBLY SYSTEMS; HOLE SURFACE; INTERFERENCE FIT; INTERFERENCE TOLERANCE; MICRO-SCALES;

ASSEMBLY; TUNGSTEN; TUNGSTEN CARBIDE;

RIVETS;

EID: 77949392493     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAM.2009.5376920     Document Type: Conference Paper

References (7)

1. J. F. Jones, D. M. Kozlowski and J. C. Trinkle. "Micro-scale force-fit insertion," Journal of Micromechatronics, Vol. 2, No. 3-4, pp. 185-200, 2004.
2. J. F. Jones and G. Aigeldinger, "An experiment towards establishing the tolerance of micro-scale interference fits," American Society for Precision Engineering 2004 Annual Meeting, Orlando, FL, pp.445-449, Oct 26-28.
3. J. F. Jones, et al. "Experiments in Sub-Millimeter Interference Fits." 5th International workshop on microfactories, France, October 2006.
4. B. Fabien, L. Hubert, J. Jacques and G. Grégoire, "Experimental results of submillimetric press-fit," 5th International workshop on microfactories, France, October 2006.
5. nd ed., Mcgraw-Hill.
6. http://www.matweb.com
7. th ed., Prentice Hall.