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Volumn 613, Issue 1, 2010, Pages 46-53
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Mass characterization of multi-pixel photon counters for the T2K 280 m near detector
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Author keywords
APD; Geiger mode; Mass production; MPPC; Photodetector; Quality control
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Indexed keywords
PHOTODETECTORS;
PHOTONS;
QUALITY CONTROL;
TEST FACILITIES;
DARK NOISE;
GEIGER MODES;
MASS PRODUCTION;
MEAN GAIN;
MPPC;
MULTI-PIXEL PHOTON COUNTERS;
PIXELS;
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EID: 77949334840
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2009.11.042 Document Type: Article |
Times cited : (6)
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References (5)
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