Measuring magnetic profiles at manganite surfaces with monolayer resolution

Journal of Magnetism and Magnetic Materials

Volumn 322, Issue 9-12, 2010, Pages 1212-1216

  Verna, A ^a   Davidson, Bruce A ^a   Szeto, Y ^b   Petrov, A Yu ^a   Mirone, A ^c   Giglia, A ^a   Mahne, N ^a   Nannarone, S ^a,d  

^a LABORATORIO TASC   (Italy)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

Dead layer; Manganite; Resonant magnetic scattering; Spintronics; Thin film; XRMS

Indexed keywords

ABSORPTION MEASUREMENTS; AIR-EXPOSED SURFACES; BEAM LINES; DEAD LAYER; DEAD LAYERS; ELLIPTICAL POLARIZATION; FREE PARAMETERS; FREQUENCY RANGES; GRAZING ANGLES; HETEROSTRUCTURES; IMAGINARY PARTS; INJECTED CURRENT; INTERFERENCE PHENOMENA; JUNCTION INTERFACES; MAGNETIC PROFILES; MAGNETIC TUNNEL JUNCTION; MAGNETIZATION DIRECTION; MAGNETIZATION PROFILE; MAGNETIZATION STATE; OXIDE HETEROSTRUCTURES; REFLECTIVITY SPECTRA; RESONANT CONDITION; RESONANT MAGNETIC SCATTERING; SCATTERING PLANE; SPECULAR REFLECTIVITY; SPINTRONICS; SRTIO; SUBNANOMETER RESOLUTION; TRIESTE; UNIT CELLS; X-RAY MAGNETIC SCATTERING;

CRYSTALS; MAGNETIC DEVICES; MAGNETIC MATERIALS; MANGANESE; MANGANESE OXIDE; MONOLAYERS; NANOTECHNOLOGY; OPTICAL CONSTANTS; OXIDE MINERALS; POLARIZATION; REFLECTION; REFRACTIVE INDEX; SCATTERING; SPIN DYNAMICS; THIN FILM DEVICES; THIN FILMS; TUNNEL JUNCTIONS;

MAGNETIZATION;

EID: 77949307948     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2009.05.022     Document Type: Article

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