Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers

Review of Scientific Instruments

Volumn 81, Issue 2, 2010, Pages

  Chung, Koo Hyun ^a   Reitsma, Mark G ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CALIBRATION METHOD; CALIBRATION PARAMETERS; FRICTION MEASUREMENTS; LATERAL FORCE MICROSCOPES; LINEAR FUNCTIONS; OPTICAL LEVER;

ATOMIC FORCE MICROSCOPY; CALIBRATION; LOCATION; SULFUR COMPOUNDS;

NANOCANTILEVERS;

EID: 77949300948     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3276709     Document Type: Conference Paper

References (16)

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12. Since an AFM cantilever is usually mounted at a small angle relative to a nominal planar surface, a geometrical correction is required to resolve force perpendicular to the surface plane. For example, see S. A. Edwards, W. A. Ducker, and J. E. Sader, J. Appl. Phys. 0021-8979 103, 064513 (2008). 10.1063/1.2885734
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14. Unless otherwise stated, measurement quantities represent a mean value and one standard deviation.
15. Cantilever flexural stiffness was determined using the thermal noise method. For example, see G. A. Matei, E. J. Thoreson, J. R. Pratt, D. B. Newell, and N. A. Burnham, Rev. Sci. Instrum. 0034-6748 77, 083703 (2006). 10.1063/1.2336115
16. See supplementary material at http://dx.doi.org/10.1063/1.3276709 E-RSINAK-81-012001 for a description of the experimental procedure used to determine pivot-cantilever contact positions.