Flexible readout and integration sensor (FRIS): New class of imaging sensor arrays optimized for air and missile defense

Johns Hopkins APL Technical Digest (Applied Physics Laboratory)

Volumn 28, Issue 3, 2010, Pages 252-253

  Rizk, C G ^a   Pouliquen, P O ^b   Andreou, A G ^b  

^a JOHNS HOPKINS UNIVERSITY APPLIED PHYSICS LABORATORY   (United States)

^b JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

A/D CONVERTER; DIGITAL EVENTS; FRAME RATE; HIGH RATE; IMAGING SENSORS; MISSILE DEFENSE; NYQUIST RATE; UPPER LIMITS;

ANALOG TO DIGITAL CONVERSION; SENSOR ARRAYS; SHIFT REGISTERS;

MILITARY ROCKETS;

EID: 77949289363     PISSN: 02705214     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (1)

1. Andreou, A. G., Pouliquen, P. O., and Rizk, C. G., "Noise Analysis and Comparison of Analog and Digital Readout Integrated Circuits for Infrared Focal Plane Arrays," in Proc. of the 43rd Annu. Conf. on Information Sciences and Systems (CISS09), Baltimore, MD, pp. 695-699 (18-20 Mar 2009).