Stoichiometric study of the dielectric and magnetic properties in charge frustrated system LuFe2O4

Ferroelectrics

Volumn 378, Issue 1 PART 1, 2009, Pages 175-180

  Michiuchi, Takamasa ^a   Yokota, Yusuke ^a   Komatsu, Takuma ^a   Hayakawa, Hironori ^a   Kuroda, Tomoko ^a   Maeda, Daisuke ^a   Matsuo, Yoji ^b   Mori, Shigeo ^b   Yoshii, Kenji ^c   Hanasaki, Noriaki ^a   Kambe, Takashi ^a   Ikeda, Naoshi ^a  

^a OKAYAMA UNIVERSITY   (Japan)

^b Osaka Prefecture University   (Japan)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

Dielectric properties; LuFe2O4; Magnetic properties

Indexed keywords

CHARGE FRUSTRATION; CHARGE ORDERING; CRYSTAL GROWING; DIELECTRIC AND MAGNETIC PROPERTIES; HIGH RESISTIVITY; LUFE2O4; OXYGEN DEFICIENCY; OXYGEN STOICHIOMETRY; ROOM TEMPERATURE;

FERROELECTRICITY; OXYGEN; RECTANGULAR WAVEGUIDES; SINGLE CRYSTALS; STOICHIOMETRY;

MAGNETIC PROPERTIES;

EID: 77949285402     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190902859187     Document Type: Conference Paper

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