Structural and magnetic characterization of LaSrMnO3 thin films deposited by laser ablation on MgO substrates

Journal of Magnetism and Magnetic Materials

Volumn 322, Issue 9-12, 2010, Pages 1174-1177

  Gomes, I T ^a   Almeida, B G ^a   Lopes, A M L ^b   Araujo J P ^b   Barbosa, J ^a   Mendes, J A ^a,c  

^a UNIVERSITY OF MINHO   (Portugal)

^b UNIVERSITY OF PORTO   (Portugal)

^c Inst Politécnico do Porto   (Portugal)

Author keywords

Electrical properties; LSMO thin films; Magnetic properties; Structure; Under oxidized; X Ray reflectivity

Indexed keywords

ELECTRICAL PROPERTY; ELECTRICAL RESISTIVITY MEASUREMENTS; INSULATING MATRIX; INTERFACIAL REGION; LOW OXYGEN PRESSURE; MAGNETIC CHARACTERIZATION; METAL INSULATOR TRANSITION TEMPERATURE; METALLIC PHASE; MGO SUBSTRATE; OXYGEN DEFICIENCY; STRUCTURAL AND MAGNETIC PROPERTIES; THIN FILMS-MAGNETIC; X RAY REFLECTIVITY;

ELECTRIC CONDUCTIVITY; INSULATION; LASER ABLATION; LASER APPLICATIONS; MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MAGNETISM; MANGANESE OXIDE; METAL INSULATOR BOUNDARIES; METAL INSULATOR TRANSITION; OXYGEN; REFLECTION; SEMICONDUCTOR INSULATOR BOUNDARIES; THIN FILMS; X RAY DIFFRACTION;

STRUCTURAL PROPERTIES;

EID: 77949284329     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2009.06.072     Document Type: Article

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