Reliability of a system of k nodes for high performance computing applications

IEEE Transactions on Reliability

Volumn 59, Issue 1, 2010, Pages 162-169

  Gottumukkala, Narasimha Raju ^a,b   Nassar, Raja ^b   Paun, Mihaela ^b,c   Leangsuksun, Chokchai Box ^b   Scott, Stephen L ^d  

^a UNIVERSITY OF LOUISIANA AT LAFAYETTE   (United States)

^b Louisiana Tech University   (United States)

^c SPIRU HARET UNIVERSITY   (Romania)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

System reliability; System time to failure; Weibull distribution

Indexed keywords

EXPONENTIAL DISTRIBUTIONS; FAILURE RATE; HIGH PERFORMANCE COMPUTING SYSTEMS; HIGH-PERFORMANCE COMPUTING APPLICATIONS; MEAN TIME TO FAILURE; OBSERVED DATA; ON TIME; PERFORMANCE LOSS; RELIABILITY ESTIMATION; SYSTEM RELIABILITY; SYSTEM TIME TO FAILURE; TIME TO FAILURE; TIME-VARYING FAILURE RATES; WEIBULL;

FAULT TOLERANCE; MOBILE TELECOMMUNICATION SYSTEMS; QUALITY ASSURANCE; WEIBULL DISTRIBUTION;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 77949275829     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2009.2034291     Document Type: Article

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