Determination of lamellar twisting manner in a banded spherulite with scanning microbeam X-ray scattering

Polymer

Volumn 51, Issue 7, 2010, Pages 1632-1638

  Kikuzuki, Tatsuya ^a   Shinohara, Yuya ^a   Nozue, Yoshinobu ^b   Ito, Kazuki ^c   Amemiya, Yoshiyuki ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b SUMITOMO CHEMICAL CO LTD   (Japan)

^c RIKEN HARIMA INSTITUTE   (Japan)

Author keywords

A banded spherulite; Lamellar twisting; Scanning microbeam X ray diffraction

Indexed keywords

X RAY DIFFRACTION; X RAY SCATTERING;

BANDED SPHERULITE; CRYSTALLIZATION TEMPERATURE; LAMELLAR TWISTING; PACKING STRUCTURE; POLY (EPSILONCAPROLACTONE); POLY(VINYL BUTYRAL); RADIAL DIRECTION; SCANNING MICROBEAM;

SCANNING;

CRYSTALLIZATION; PACKAGING; PHASE SEPARATION; POLYCAPROLACTONE; SCANNING ELECTRON MICROSCOPY; TWISTING;

EID: 77949275168     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2010.01.057     Document Type: Article

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