Nanostructure formation due to impact of highly charged ions on mica

Vacuum

Volumn 84, Issue 8, 2010, Pages 1062-1065

  Ritter, R ^a   Kowarik, G ^a   Meissl, W ^a   El Said, A S ^a   Maunoury, L ^b   Lebius, H ^b   Dufour, C ^b   Toulemonde, M ^b   Aumayr, F ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b DIF   (France)

Author keywords

AFM; Feature erasure; Friction; Hillocks; Mica; Nanostructuring

Indexed keywords

AFM; CHARGE STATE; CONTACT MODE ATOMIC FORCE MICROSCOPY; CONTINUOUS SCANNING; EXPERIMENTAL INVESTIGATIONS; FEATURE ERASURE; FRICTIONAL FORCES; HEIGHT MEASUREMENT; HIGHLY CHARGED IONS; MUSCOVITE MICA; NANO-SIZED; NANO-STRUCTURING; NANOSTRUCTURE FORMATION; SURFACE MODIFICATION; TAPPING MODES;

ATOMIC FORCE MICROSCOPY; CHEMICAL MODIFICATION; FRICTION; IONS; MICA; NANOSTRUCTURES; SILICATE MINERALS; SURFACE TREATMENT; XENON;

ION BOMBARDMENT;

EID: 77949266030     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2009.10.018     Document Type: Article

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