Integrated circuits: Memory grows up

Nature Nanotechnology

Volumn 5, Issue 3, 2010, Pages 177-178

  Pirovano, Agostino ^a   Schuegraf, Klaus ^b  

^a Numonyx   (Italy)

^b APPLIED MATERIALS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS; NANOTECHNOLOGY;

TIMING CIRCUITS; NANOSTRUCTURED MATERIALS;

CHALCOGEN; METAL OXIDE; NANOWIRE; OXIDE; SILICON;

ALGORITHM; COMPUTER MEMORY; COST; COST EFFECTIVENESS ANALYSIS; DATA STORAGE DEVICE; DENSITY; ELECTRICITY; INFORMATION PROCESSING; MICROSCOPY; MOBILE PHONE; PRIORITY JOURNAL; SEMICONDUCTOR; SHORT SURVEY; VELOCITY;

EID: 77749323318     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2010.36     Document Type: Short Survey

References (10)

1. http://www.his.com/~iedm/program
2. Jung, S. M. et al. IEDM 02-03 (2006).
3. Kau, D. C. et al. IEDM 27-01 (2009).
4. Bez, R. IEDM 05-01 (2009).
5. Tanaka, H. et al. in Symp. VLSI Tech. 14-15 (IEEE, 2007).
6. Ishiduki, M. et al. IEDM 27-03 (2009).
7. Hubert, A. et al. IEDM 27-06 (2009).
8. Wuttig, M. & Yamada, N. Nature Mater. 6, 824-832 (2007).
9. Servalli, G. IEDM 05-07 (2009).
10. Freitas, R. F. & Wilcke, W. W. IBM J. Res. Dev. 52, 439-448 (2008).