Kelvin probe force microscopy study on nanotriboelectrification

Applied Physics Letters

Volumn 96, Issue 8, 2010, Pages

  Sun, Hao ^a   Chu, Haibin ^a   Wang, Jinyong ^a   Ding, Lei ^a   Li, Yan ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CHARGE SIGN REVERSAL; ELECTRIC QUANTITY; ELECTROSTATIC POTENTIALS; KELVIN PROBE FORCE MICROSCOPY; RELATIVE HUMIDITIES;

ATMOSPHERIC HUMIDITY; FRICTION; PROBES;

TRIBOLOGY;

EID: 77749292127     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3330866     Document Type: Article

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19. See supplementary material at http://dx.doi.org/10.1063/1.3330866 E-APPLAB-96-057008 for experimental details and further instructions of our method.