Analysis of the self-imaging effect in plasmonic multimode waveguides

Applied Optics

Volumn 49, Issue 7, 2010, Pages

  Edelmann, André G ^a   Helfert, Stefan F ^a   Jahns, Jürgen ^a  

^a UNIVERSITY OF HAGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

PLASMONS; WAVEGUIDE COMPONENTS; WAVEGUIDE COUPLERS;

CHOICE OF PARAMETERS; DIELECTRIC MEDIUM; METALLIC WAVEGUIDE; METHOD OF LINES; MULTI-MODE WAVEGUIDES; PROPAGATING FIELD; PROPAGATION DISTANCES; SELF-IMAGING EFFECTS;

WAVEGUIDES;

EID: 77749252264     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.49.0000A1     Document Type: Article

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