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Volumn 87, Issue 25, 2009, Pages 30-33
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Next-generation risk assessment
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 77749242642
PISSN: 00092347
EISSN: 1520605X
Source Type: Trade Journal
DOI: 10.1021/cen-v087n025.p030 Document Type: Article |
Times cited : (6)
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References (0)
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