160 Gb/s/port 2 × 2 OPS node test-bed performing 50 Gchip/s all-optical active label processing with contention detection

Journal of Lightwave Technology

Volumn 28, Issue 6, 2010, Pages 922-930

  Scaffardi, Mirco ^a   Lazzeri, Emma ^b   Furukawa, Hideaki ^c   Wada, Naoya ^c   Miyazaki, Tetsuya ^c   Poti, Luca ^a   Bogoni, Antonella ^a  

^a CNIT   (Italy)

^b SCUOLA SUPERIORE SANT ANNA   (Italy)

^c NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY   (Japan)

Author keywords

Contention detection; Optical label processing; Optical packet switching; Semiconductor optical amplifiers

Indexed keywords

ACTIVE LABELS; ALL-OPTICAL; ALL-OPTICAL PROCESSING; CHIP RATE; DATA FORMAT; DISCRETE DEVICES; EFFICIENT IMPLEMENTATION; ELECTRONIC DOMAINS; ERROR FREE OPERATIONS; LABEL EXTRACTION; NETWORK NODE; NETWORK SCALABILITY; NODE PERFORMANCE; OPTICAL LABEL PROCESSING; OPTICAL PACKET SWITCHING; PACKED-SWITCHED NETWORKS; PACKET LATENCIES; POWER CONSUMPTION;

LABELS; OPTICAL SWITCHES; OPTOELECTRONIC DEVICES; PACKET SWITCHING; SEMICONDUCTOR OPTICAL AMPLIFIERS; SWITCHING; SWITCHING CIRCUITS; TEST FACILITIES;

TRANSPARENT OPTICAL NETWORKS;

EID: 77749242548     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2009.2035524     Document Type: Article

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