Thin films of molecular materials synthesized from C 32 H 20 N 10 M (M = Co, Pb, Fe): Film formation, electrical and optical properties

Applied Surface Science

Volumn 256, Issue 11, 2010, Pages 3374-3379

  Rodriguez A ^a   Sanchez Vergara M E ^b   Garcia Montalvo V ^a   Ortiz, A ^a   Alvarez, J R ^c  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^b UNIVERSIDAD ANÁHUAC   (Mexico)

^c SCHOOL OF ENGINEERING AND SCIENCES   (Mexico)

Author keywords

Electrical measurements; Optical properties; Thin films

Indexed keywords

ACTIVATION ENERGY; ATOMIC FORCE MICROSCOPY; FILM THICKNESS; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; THERMAL EVAPORATION; THIN FILMS; VACUUM EVAPORATION;

EFFECT OF TEMPERATURE; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL MEASUREMENT; OPTICAL ACTIVATION ENERGY; OPTICAL AND ELECTRICAL PROPERTIES; SPECTROPHOTOMETRIC MEASUREMENTS; THERMAL EVAPORATION PROCESS; VACUUM THERMAL EVAPORATION;

OPTICAL FILMS;

EID: 77649335810     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.12.037     Document Type: Article

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