On-line error detection techniques for dependable embedded processors with high complexity

Proceedings - 7th International On-Line Testing Workshop, IOLTW 2001

Volumn 2001-January, Issue , 2001, Pages 51-53

  Pflanz, M ^a   Walther, K ^a   Vierhaus, H T ^a  

^a BRANDENBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CODES (SYMBOLS); ERROR DETECTION;

CONCURRENT ERROR DETECTION; DOUBLE PRECISION; EMBEDDED PROCESSORS; HIGH COMPLEXITY; ON-LINE ERROR DETECTION; PIPELINE PROCESSOR; PROCESSOR DESIGN; REGISTER FILES;

PIPELINE PROCESSING SYSTEMS;

EID: 77649321240     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/olt.2001.937818     Document Type: Conference Paper

References (11)

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10. M. Pflanz, C. Galke, H. T. Vierhaus: A New Method for On-Line State Machine Observation for Embedded Microprocessors, IEEE int. High Level Design Validation and Test Workshop, Nov. 2000, Berkeley, CA, pp. 34-39
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