Guest editors' introduction to the special section on shape analysis and its applications in image understanding

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 32, Issue 4, 2010, Pages 577-578

  Srivastava, Anuj ^a   Damon, James N ^b   Dryden, Ian L ^c,d   Jermyn, Ian H ^e  

^a FLORIDA STATE UNIVERSITY   (United States)

^b University of North Carolina at Chapel Hill   (United States)

^c UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^d UNIVERSITY OF SOUTH CAROLINA   (United States)

^e INRIA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED PATTERN RECOGNITION; BIOMETRY; EDITORIAL; IMAGE PROCESSING;

BIOMETRY; IMAGE PROCESSING, COMPUTER-ASSISTED; PATTERN RECOGNITION, AUTOMATED;

EID: 77649269269     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2010.42     Document Type: Editorial

References (0)