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Volumn 24, Issue 1, 2010, Pages 58-63
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Structural and electrical properties of SrBi2V x Nb2-x O9 ferroelectric ceramics: Effect of temperature and frequency
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Author keywords
Curie temperature; Dielectric constant; Dielectric loss; Ferroelectrics
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Indexed keywords
AURIVILLIUS;
BISMUTH LAYER STRUCTURED FERROELECTRICS;
CURIE POINTS;
DIELECTRIC CONSTANT;
DIELECTRIC CONSTANT VALUES;
DIELECTRIC CONSTANTS;
DOPED SAMPLE;
EFFECT OF TEMPERATURE;
ELECTRIC AND DIELECTRIC PROPERTIES;
ELECTRICAL CONDUCTIVITY;
ELECTRICAL STUDIES;
FATIGUE RESISTANCE;
HIGH PURITY;
LAYERED MATERIAL;
LAYERED PEROVSKITE STRUCTURE;
NON-VOLATILE RANDOM ACCESS MEMORIES;
PARTIAL SUBSTITUTION;
PROCESSING CONDITION;
RELAXORS;
ROOM TEMPERATURE;
SINGLE PHASE;
SOLID-STATE REACTION TECHNIQUES;
STRUCTURAL AND ELECTRICAL PROPERTIES;
TRANSITION TEMPERATURE;
VANADIUM CONCENTRATION;
VANADIUM SUBSTITUTION;
X-RAY DIFFRACTOGRAMS;
BISMUTH;
CALCINATION;
CURIE TEMPERATURE;
DIELECTRIC DEVICES;
ELECTRIC CONDUCTIVITY;
FERROELECTRIC CERAMICS;
FERROELECTRICITY;
MICROSTRUCTURE;
NIOBIUM;
OXIDE MINERALS;
PERMITTIVITY;
PEROVSKITE;
RANDOM ACCESS STORAGE;
SINTERING;
TANTALUM;
VANADIUM;
VANADIUM ALLOYS;
DIELECTRIC LOSSES;
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EID: 77649235433
PISSN: 13853449
EISSN: 15738663
Source Type: Journal
DOI: 10.1007/s10832-008-9542-y Document Type: Article |
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Times cited : (12)
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References (21)
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