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Volumn 25, Issue 2 PART 3, 2009, Pages 1887-1896

Quantitative evaluation of transport properties of SOFC porous anode by random walk process

Author keywords

[No Author keywords available]

Indexed keywords

MICROSTRUCTURAL CONFIGURATIONS; MICROSTRUCTURAL PROPERTIES; POROUS ANODE; QUANTITATIVE EVALUATION; RANDOM WALK PROCESS; SCANNING ELECTRON MICROSCOPE; SEM; SOFC ANODE; SURFACE-TO-VOLUME RATIO; THREE PHASIS; THREE-DIMENSIONAL DATA; TRANSPORT PHENOMENA;

EID: 77649166906     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.3205731     Document Type: Conference Paper
Times cited : (28)

References (5)
  • 4
    • 77649096972 scopus 로고    scopus 로고
    • Quantification of Ni-YSZ Anode Microstructure Based on Dual Beam FIB-SEM Technique
    • H. Iwai et al. "Quantification of Ni-YSZ Anode Microstructure Based on Dual Beam FIB-SEM Technique", SOFC-XI, These Transactions.
    • SOFC-XI, These Transactions
    • Iwai, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.