Interface resistance between FeCr interconnects and La 0.85Sr0.15Mn1,1O3

ECS Transactions

Volumn 25, Issue 2 PART 2, 2009, Pages 1429-1436

  Mikkelsen, L ^a   Neufeld, K ^a   Hendriksen, P V ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION RATE; DUAL LAYER COATINGS; ELECTRICAL INTERFACE; FECR ALLOYS; FOUR-POINT METHOD; INTERFACE RESISTANCE; LONG TERM; MICROSTRUCTURE ANALYSIS; OUTER LAYER; OXIDATION BEHAVIOURS; OXIDE SCALE; PLANSEE; SEM/EDX;

ALLOYS; CHROMIUM; DEGRADATION; MANGANESE; MANGANESE COMPOUNDS; MICROSTRUCTURE; SCALE (DEPOSITS); SOLID OXIDE FUEL CELLS (SOFC);

LANTHANUM;

EID: 77649119985     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.3205675     Document Type: Conference Paper

References (6)

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3. A. Petric and H. Ling, J. Am. Ceram. Soc., 90, 1515, (2007).
4. J. E. Hammer, S. J. Laney, R. W. Jackson, K. Coyne, et al, Oxid. Met., 67, 1, (2007).
5. J. Froitzheim, G. H. Meier, L. Niewolak, et al, J. Power Sources, 178, 163, (2008).
6. X. Chen, P. Y. Hou, C. P. Jacobson, et al, Solid State Ionics, 176, 425 (2005).