Effect of the compact TiO2 layer on charge transfer between N3 Dyes and TiO2 investigated by Raman spectroscopy

Journal of Physical Chemistry C

Volumn 114, Issue 7, 2010, Pages 3185-3189

  Wang, Hsuan Fu ^a   Chen, Liang Yih ^a   Su, Wei Nien ^a   Chung, Jen Chieh ^b   Hwang, Bing Joe ^a,c  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b INSTITUTE OF NUCLEAR ENERGY RESEARCH   (Taiwan)

^c NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPACT LAYER; DYE-SENSITIZED SOLAR CELLS; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY MEASUREMENTS; ELECTRON TRANSFER; INTERNAL RESISTANCE; PHOTOELECTRODE; RAMAN SPECTROSCOPIC; RED SHIFT; SYNTHESIS TEMPERATURES; TIO; VIBRATION MODES;

ASTROPHYSICS; CHARGE TRANSFER; CONVERSION EFFICIENCY; DOPPLER EFFECT; ELECTROCHEMICAL CORROSION; ENERGY CONVERSION; ION EXCHANGE; MASS TRANSFER; NANOPARTICLES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SOLAR CELLS; SYNTHESIS (CHEMICAL);

ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY;

EID: 77649113608     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp908233h     Document Type: Article

References (16)

1. Grätzel, M. Nature 2001, 414 (6861), 338-344.
2. Wang, H. F.; Su, W. N.; Hwang, B. J. Electrochem. Commun. 2009, 11 (8), 1647-1649.
3. Xia, J.; Masaki, N.; Jiang, K.; Yanagida, S. J. Phys. Chem. B 2006, 110 (50), 25222-25228.
4. Gao, K.; Wang, D., Phys. Status Solidi RRL 2007, 1 (2).
5. Umapathy, S.; Cartner, A. M.; Parker, A. W.; Hester, R. E. J. Phys. Chem. 1990, 94 (26), 8880-8885.
6. Jang, S. R.; Vittal, R.; Lee, J.; Jeong, N.; Kim, K. J. Chem. Commun. 2006, (1), 103-105.
7. Zhang, D.; Downing, J. A.; Knorr, F. J.; McHale, J. L. J. Phys. Chem. B 2006, 110 (43), 21890-21898.
8. Shoute, L. C. T.; Loppnow, G. R. J. Am. Chem. Soc. 2003, 125 (50), 15636-15646.
9. Hugot-Le Goff, A.; Joiret, S.; Falaras, P. J. Phys. Chem. B 1999, 103 (44), 9569-9575.
10. Quagliano, L. G.; Jusserand, B.; Orani, D. J. Raman Spectrosc. 1998, 29 (8), 720-724.
11. Barb, C. J.; Arendse, F.; Comte, P.; Jirousek, M.; Lenzmann, F.; Shklover, V.; Grätzel, M. J. Am. Ceram. Soc. 1997, 80 (12), 3157-3171.
12. Yen, C. Y.; Lin, Y. F.; Liao, S. H.; Weng, C. C.; Huang, C. C.; Hsiao, Y. H.; Ma, C. C. M.; Chang, M. C.; Shao, H.; Tsai, M. C.; Hsieh, C. K.; Tsai, C. H.; Weng, F. B., Nanotechnology 2008, 19 (37).
13. Han, L.; Koide, N.; Chiba, Y.; Mitate, T. Appl. Phys. Lett. 2004, 84 (13), 2433-2435.
14. Han, L.; Koide, N.; Chiba, Y.; Islam, A.; Komiya, R.; Fuke, N.; Fukui, A.; Yamanaka, R. Appl. Phys. Lett. 2005, 86 (21), 1-3.
15. Mikami, M.; Nakamura, S.; Kitao, O.; Arakawa, H. Phys. Rev. B: Condens. Matter Mater. Phys. 2002, 66 (15), 1552131-1552136.
16. Pérez León, C.; Kador, L.; Peng, B.; Thelakkat, M. J. Phys. Chem. B 2006, 110 (17), 8723-8730.