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Volumn 25, Issue 2 PART 3, 2009, Pages 2899-2908

Chromium poisoning of LSM cathodes - Results from stack testing

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED CURRENT; CELL MATERIALS; CHROMIUM POISONING; DEGRADATION MECHANISM; DEGRADATION RATE; LIFE-TIMES; OPERATION TIME; POSTMORTEM ANALYSIS; SEM MICROGRAPHS; SINGLE CELL MEASUREMENT; SINGLE CELLS; SOLID OXIDE; STACK TESTING; WET CHEMICAL ANALYSIS;

EID: 77649096133     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.3205855     Document Type: Conference Paper
Times cited : (23)

References (5)
  • 1
    • 77649125485 scopus 로고    scopus 로고
    • R. Steinberger-Wilckens, L. G. J. de Haart, I. C. Vinke, L. Blum, A. Cramer, J. Remmel, G. Blaß, F. Tietz, W. J. Quadakkers, SOFC-VIII, 2003, p. 98.
    • R. Steinberger-Wilckens, L. G. J. de Haart, I. C. Vinke, L. Blum, A. Cramer, J. Remmel, G. Blaß, F. Tietz, W. J. Quadakkers, SOFC-VIII, 2003, p. 98.
  • 2
    • 77649105484 scopus 로고    scopus 로고
    • N. H. Menzler, P. Batfalsky, L. Blum, M. Bram, S. M. Groß, V. A. C. Haanappel, J. Malzbender, V. Shemet, R. W. Steinbrech, I. Vinke, SOFC Forum 2006, Lucerne, Switzerland.
    • N. H. Menzler, P. Batfalsky, L. Blum, M. Bram, S. M. Groß, V. A. C. Haanappel, J. Malzbender, V. Shemet, R. W. Steinbrech, I. Vinke, SOFC Forum 2006, Lucerne, Switzerland.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.