Charged kaon mass measurement using the Cherenkov effect

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 615, Issue 1, 2010, Pages 27-32

  Graf, N ^e   Lebedev, A ^c   Abrams, R J ^j   Akgun, U ⁱ   Aydin, G ⁱ   Baker, W ^b   Barnes Jr , P D ^f   Bergfeld, T ^k   Beverly, L ^b   Bujak, A ^g   Carey, D ^b   Dukes, C ^l   Duru, F ⁱ   Feldman, G J ^c   Godley, A ^k   Gulmez E ⁱ   Gunaydin Y O ⁱ   Gustafson, H R ^j   Gutay, L ^g   Hartouni, E ^f   Hanlet, P ^d   Hansen, S ^b   Heffner, M ^f   Johnstone, C ^b   Kaplan, D ^d   Kamaev, O ^d   Kilmer, J ^b   Klay, J ^f   Kostin, M ^b   Lange, D ^f   Ling, J ^k   Longo, M J ^j   Lu, L C ^l   Materniak, C ^l   Messier, M D ^e   Meyer, H ^b   Miller, D E ^g   Mishra, S R ^k   Nelson, K ^l   Nigmanov, T ^j   Norman, A ^l   Onel, Y ⁱ   Paley, J M ^e   Park, H K ^j   Penzo, A ⁱ   Peterson, R J ^h   Raja, R ^b   Rajaram, D ^j   Ratnikov, D ^d   Rosenfeld, C ^k   Rubin, H ^d   Seun, S ^c   Solomey, N ^d   Soltz, R ^f   Swallow, E ^a   Schmitt, R ^b   Subbarao, P ^j   Torun, Y ^d   Tope, T E ^b   Wilson, K ^k   Wright, D ^f   Wu, K ^k   more..

^a ELMHURST COLLEGE   (United States)

^b FERMI NATIONAL ACCELERATOR LABORATORY   (United States)

^c HARVARD UNIVERSITY   (United States)

^d ILLINOIS INSTITUTE OF TECHNOLOGY   (United States)

^e INDIANA UNIVERSITY   (United States)

^f LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^g PURDUE UNIVERSITY   (United States)

^h UNIVERSITY OF COLORADO   (United States)

ⁱ UNIVERSITY OF IOWA   (United States)

^j UNIVERSITY OF MICHIGAN   (United States)

^k UNIVERSITY OF SOUTH CAROLINA   (United States)

^l UNIVERSITY OF VIRGINIA   (United States)

more..

Author keywords

Charged kaon mass; Cherenkov effect; RICH detector

Indexed keywords

CHERENKOV EFFECT; CHERENKOV LIGHT; FERMI NATIONAL ACCELERATOR LABORATORIES; KAONIC ATOMS; MAIN INJECTOR PARTICLE PRODUCTIONS; MASS MEASUREMENTS; NARROW BANDS; ORDERS OF MAGNITUDE; PRECISE MEASUREMENTS; RICH DETECTORS; X RAY DATA;

ELEMENTARY PARTICLES; NUCLEAR INSTRUMENTATION; PROTONS;

UNCERTAINTY ANALYSIS;

EID: 77549083799     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.12.082     Document Type: Article

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