A Probabilistic Approach to Fault Diagnosis of Industrial Systems

IEEE Transactions on Control Systems Technology

Volumn 12, Issue 6, 2004, Pages 950-955

  Barigozzi, Alberto ^a   Magni, Lalo ^b   Scattolini, Riccardo ^c  

^a IBM   (Italy)

^b UNIVERSITY OF PAVIA   (Italy)

^c POLITECNICO DI MILANO   (Italy)

Author keywords

Automata; automotive; fault diagnosis; finite state machines; probabilistic models

Indexed keywords

ACTUATORS; AUTOMOTIVE INDUSTRY; FINITE AUTOMATA; INDUSTRIAL APPLICATIONS; INDUSTRIAL PLANTS; MATHEMATICAL MODELS; PROBABILITY; SENSORS;

DIAGNOSTIC TESTS; FAULT DIAGNOSIS; FINITE STATE MACHINES; INDUSTRIAL SYSTEMS; PROBABILISTIC MODELS;

STOCHASTIC CONTROL SYSTEMS;

EID: 7744225681     PISSN: 10636536     EISSN: 15580865     Source Type: Journal    
DOI: 10.1109/TCST.2004.833606     Document Type: Article

References (20)

1. M. Basseville and I. V. Nikiforov, Detection of Abrupt Changes: Theory and Applications. Englewood Cliffs, NJ: Prentice-Hall, 1993.
2. R. J. Patton, P. M. Frank, and R. N. Clark, Fault Diagnosis in Dynamic Systems: Theory and Applications. Englewood Cliffs, NJ: Prentice Hall, 1989.
3. J. J. Gertler, Fault Detection and Diagnosis in Engineering Sys tems. NewYork: Marcel Dekker, 1998.
4. M. I. K. Aoki, E. O'Shima, and H. Matsuyama,“An algorithm for diag nosis of system failures in the chemical process,” Comput. Chem. Eng., vol. 3, pp. 489-493, 1979.
5. J. Guan and J. H. Graham,“Diagnostic reasoning with fault propagation digraph and sequential testing,” IEEE Trans. Syst., Man, Cybern., vol. 24, pp. 1552-1558, Oct. 1994.
6. J. M. Koscielny,“Fault isolation in industrial processes by the dynamic table of states method,” Automatica, vol. 31, pp. 747-753, 1995.
7. E. S. Yoon and J. H. Han,“Process failure detection and diagnosis using the tree model,” in Proc. IFAC World Congr., 1987, pp. 126-129.
8. M. Chow, R. N. Sharpe, and J. C. Hung,“On the application and design consideration of artificial neural network fault detectors,” IEEE Trans. Ind. Electron., vol. 40, pp. 181-198, Apr. 1993.
9. K. Watanabe, S. Hirota, L. Hou, and D. M. Himmelblau,“Diagnosis of multiple simultaneous fault via hierarchical artificial neural networks,” AIChE J., vol. 40, pp. 839-848, 1994.
10. J. De Keer, A. K. Mackworth, and R. Reiter,“Characterizing diagnoses and systems,” Artif. Intell., vol. 56, pp. 197-222, 1992.
11. L. H. Chiang, E. L. Russel, and R. D. Braatz, Fault Detection and Diagnosis in Industrial Systems. New York: Springer-Verlag, 2001.
12. R. Isermann and P. Ballé,“Trends in the application of model-based fault detection and diagnosis of technical processes,” Control Eng. Practice, vol. 5, pp. 709-719, 1997.
13. H. E. Garcia and R. B. Vilim,“Combining physical modeling, neural processing, and likelihood testing for online process monitoring,” in Proc. IEEE Int. Conf. Systems, Man Cybernetics, vol. 1, Piscataway, NJ, 1998, pp. 806-810.
14. D. Mylaraswamy and V. Venkatasubramanian,“A hybrid framework for large scale process fault diagnosis,” Comput. Chem. Eng., vol. 21-S, pp. S935-S940, 1997.
15. R. Isermann and M. Ulieru,“Integrated fault detection and diagnosis, systems,” in Proc. IEEE Conf. Systems, Man Cybernetics: Systems En gineering Service of Human, 1993, pp. 743-748.
16. G. Biswas, R. Kapadia, and X. W. Yu,“Combined qualitative-quantita tive steady-state diagnosis of continuous-valued systems,” IEEE Trans. Syst., Man, Cybern. A, vol. 27, pp. 167-185, Mar. 1997.
17. L. Magni, R. Scattolini, and C. Rossi,“A fault detection and isolation method for complex industrial systems,” IEEE Trans. Syst., Man, Cy bern. A, vol. 30, pp. 860-865, Nov. 2000.
18. L. Magni, R. Scattolini, and C. Rossi,“A design methodology for diagnostic strategies for industrial sys tems,” Int. J. Syst. Sci., vol. 33, pp. 505-512, 2002.
19. M. Sampath, R. Sengupta, S. Lafortune, K. Sinnamohideen, and D. Teneketzis,“Failure diagnosis using discrete event models,” IEEE Trans. Contr. Syst. Technol., vol. 4, pp. 105-124, Mar. 1996.
20. C. G. Cassandras and S. Lafortune, Introduction to Discrete Event Systems. Norwell, MA: Kluwer, 1999.