Electroabsorption spectroscopy analysis of quantum-well modulator extinction and chirp

IEEE Photonics Technology Letters

Volumn 16, Issue 11, 2004, Pages 2463-2465

  Kim, In ^a   Jang, Dong Hoon ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; DISTRIBUTED FEEDBACK LASERS; LIGHT EMISSION; LIGHT EXTINCTION; LIGHT MODULATION; LIGHT POLARIZATION; QUANTUM WELL LASERS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR QUANTUM WELLS; STRAIN;

ABSORPTION EDGE BROADENING; ELECTROABSORPTION (EA); ELECTROABSORPTION SPECTROSCOPY; PLANAR WAFER; QUANTUM WELL MODULATOR;

LIGHT MODULATORS;

EID: 7744224157     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2004.835640     Document Type: Article

References (6)

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