Bayesian modeling of recurrent event data with dependent censoring

Communications in Statistics: Simulation and Computation

Volumn 39, Issue 3, 2010, Pages 641-654

  Bandyopadhyay, Nibedita ^a   Sen, Ananda ^b  

^a JOHNSON AND JOHNSON PHARMACEUTICAL RESEARCH AND DEVELOPMENT   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Bayesian analysis; Dependent censoring; Frailty; Log skew t; Recurrent event

Indexed keywords

EID: 77349121869     PISSN: 03610918     EISSN: 15324141     Source Type: Journal    
DOI: 10.1080/03610910903551766     Document Type: Article

References (28)