Dielectric spectroscopy of LiNbO3 and TmNbO4 nanocrystals embedded in a SiO2 glass matrix

Journal of Non-Crystalline Solids

Volumn 356, Issue 11-17, 2010, Pages 800-804

  Valente, M A ^a   Silva, C C ^a,b   Sombra, A S B ^b   Graca M P F ^a  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b FEDERAL UNIVERSITY OF CEARÁ   (Brazil)

Author keywords

Conductivity; Dielectric properties; Electric modulus; Glass ceramics; Relaxation; Scanning electron microscopy; Silicates; Sol Gels (xerogels); X ray diffraction

Indexed keywords

AC CONDUCTIVITY; CRYSTAL PHASE; CRYSTAL PHASIS; DC CONDUCTIVITY; DIELECTRIC MEASUREMENTS; DIELECTRICAL PROPERTIES; DRIED GEL; ELECTRIC MODULUS; GLASS MATRICES; PARTICLES SIZES; SEM; SOL-GEL METHODS; SOL-GELS (XEROGELS); XRD;

DIELECTRIC PROPERTIES; DIFFRACTION; GLASS CERAMICS; HOLOGRAPHIC INTERFEROMETRY; SCANNING; SCANNING ELECTRON MICROSCOPY; SILICATES; SOL-GEL PROCESS; SOLS; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION; XEROGELS;

SOL-GELS;

EID: 77349109718     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2009.09.044     Document Type: Article

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