Preparation and characterization of nanocrystalline CeO2-Tb 2O3 films obtained by electrochemical deposition method

Journal of Physical Chemistry C

Volumn 114, Issue 3, 2010, Pages 1424-1429

  Qu, Dunlin ^a   Xie, Fangyan ^b   Meng, Hui ^c   Gong, Li ^b   Zhang, Weihong ^b   Chen, Jian ^a   Li, Gaoren ^a   Liu, Peng ^a   Tong, Yexiang ^a  

^a PCFM Laboratory   (China)

^b Instrumental Analysis and Research Center   (China)

^c SUN YAT SEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE OXIDE; CONCENTRATION OF; CRYSTAL SIZE; ELECTROCHEMICAL DEPOSITION; LARGE SURFACE AREA; NANOCRYSTALLINES; SEM; XPS ANALYSIS; XRD;

COMPOSITE FILMS; ELECTRODEPOSITION; FILM PREPARATION; MAGNETIC PROPERTIES; MORPHOLOGY; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REDUCTION; SCANNING ELECTRON MICROSCOPY; TERBIUM ALLOYS; X RAY DIFFRACTION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77249177692     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp907628g     Document Type: Article

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