Influence of phase transition induced by residual stress on ferroelectric properties of highly (1 0 0)-oriented Pb(Zr0.52Ti0.48)O3 thin films

Journal of Alloys and Compounds

Volumn 493, Issue 1-2, 2010, Pages 499-501

  Liu, C Q ^a   Li, W L ^a   Fei, W D ^a   Zhang, S Q ^a   Wang, J N ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Ferroelectric; Phase transition; Thin film

Indexed keywords

DIFFERENT THICKNESS; FERROELECTRIC; FERROELECTRIC PHASE TRANSITION; FERROELECTRIC PROPERTY; MONOCLINIC PHASE; MONOCLINIC PHASE TRANSITIONS; MORPHOTROPIC PHASE BOUNDARIES; POLARIZATION BEHAVIOR; POLYCRYSTALLINE; PREFERRED ORIENTATIONS; PZT FILM; SI SUBSTRATES; SOL-GEL METHODS;

FERROELECTRICITY; LEAD; SOL-GEL PROCESS; THIN FILM DEVICES; THIN FILMS; ZIRCONIUM;

PHASE TRANSITIONS;

EID: 77249114134     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.12.143     Document Type: Article

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