A neural network ensemble model for on-line monitoring of process mean and variance shifts in correlated processes

Expert Systems with Applications

Volumn 37, Issue 6, 2010, Pages 4058-4065

  Wu, Bin ^a   Yu, Jian bo ^b  

^a SHANGHAI DIANJI UNIVERSITY   (China)

^b SHANGHAI UNIVERSITY   (China)

Author keywords

Correlated manufacturing process; Pattern recognition; Selective neural network ensemble; Statistical process control

Indexed keywords

ASSIGNABLE CAUSE; AVERAGE RUN LENGTHS; CONVENTIONAL CONTROL; GENERALIZATION PERFORMANCE; IDENTIFICATION MODEL; LEARNING-BASED METHODS; MANUFACTURING PROCESS; NETWORK ENSEMBLE; NEURAL NETWORK ENSEMBLES; ONLINE MONITORING; PROCESS CHANGE; PROCESS MEAN; SIMULATION RESULT; SINGLE NEURAL; VARIANCE SHIFTS;

IDENTIFICATION (CONTROL SYSTEMS); INDUSTRIAL ENGINEERING; NEURAL NETWORKS; PATTERN RECOGNITION; PRODUCTION ENGINEERING; QUALITY CONTROL; SURFACE TREATMENT; VOLTAGE MEASUREMENT;

STATISTICAL PROCESS CONTROL;

EID: 77249092144     PISSN: 09574174     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eswa.2009.11.051     Document Type: Article

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