Ultrashort free-carrier lifetime in low-loss silicon nanowaveguides

Optics Express

Volumn 18, Issue 4, 2010, Pages 3582-3591

  Turner Foster, Amy C ^a   Foster, Mark A ^a   Levy, Jacob S ^a   Poitras, Carl B ^a   Salem, Reza ^a   Gaeta, Alexander L ^a   Lipson, Michal ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PHASE SHIFT; WAVEGUIDES;

FIGURE OF MERIT; LINEAR PROPAGATION; LOW LOSS; NANOWAVEGUIDES; NONLINEAR PHASE SHIFT; P-I-N STRUCTURE; PIN DIODE; PROPAGATION LOSS; REVERSE BIAS; SILICON WAVEGUIDE;

CARRIER LIFETIME;

NANOMATERIAL; SILICON;

ARTICLE; CHEMISTRY; ELECTROMAGNETIC FIELD; ELECTRON TRANSPORT; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; LIGHT; NANOTECHNOLOGY; RADIATION SCATTERING; SEMICONDUCTOR; ULTRASTRUCTURE;

ELECTROMAGNETIC FIELDS; ELECTRON TRANSPORT; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LIGHT; NANOSTRUCTURES; NANOTECHNOLOGY; SCATTERING, RADIATION; SEMICONDUCTORS; SILICON;

EID: 77149146783     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.003582     Document Type: Article

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